Transient latch-up: Experimental analysis and device simulation

A set-up consisting of at least one pulse generator with baseline functionality was used for Transient Latch-up (TLU) investigations. Dependencies of the TLU sensitivity of test structures on the pulse width and the rise time have been analyzed. Device simulation could reproduce the tendencies and reveals the root cause for the dependencies. In a bipolar product, which is immune against static latch-up, transient latch-up could be triggered, showing clearly the importance of a TLU characterization and the capability of the set-up.