DocumentCode :
503075
Title :
Transient latch-up: Experimental analysis and device simulation
Author :
Franke, S. Bargstädt ; Stadler, Wolfgang ; Esmark, K. ; Streibl, M. ; Domanski, K. ; Gieser, H. ; Wolf, H. ; Bala, W.
Author_Institution :
CL DAT LIB IO, Infineon Technol. AG, Munich, Germany
fYear :
2003
fDate :
21-25 Sept. 2003
Firstpage :
1
Lastpage :
8
Abstract :
A set-up consisting of at least one pulse generator with baseline functionality was used for Transient Latch-up (TLU) investigations. Dependencies of the TLU sensitivity of test structures on the pulse width and the rise time have been analyzed. Device simulation could reproduce the tendencies and reveals the root cause for the dependencies. In a bipolar product, which is immune against static latch-up, transient latch-up could be triggered, showing clearly the importance of a TLU characterization and the capability of the set-up.
Keywords :
flip-flops; pulse generators; one pulse generator; static latch-up; transient latch-up; Analytical models; Circuit simulation; Computational modeling; Electrostatic discharge; Microscopy; Power supplies; Pulsed power supplies; Space vector pulse width modulation; Testing; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
Type :
conf
Filename :
5272038
Link To Document :
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