• DocumentCode
    503162
  • Title

    A novel thermo-mechanical test method of fatigue characterization of real solder joints

  • Author

    Metasch, R. ; Roellig, M. ; Wolter, K.-J.

  • Author_Institution
    Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2009
  • fDate
    15-18 June 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The paper presents a novel thermo-mechanical test method for in-situ force measurement on real solder joints during thermal cycling test. Due to plastic deformation in solder joints the solder-material-matrix is damaged and micro cracks occur. This degradation behaviour can be determined by direct force measurement under thermal cycling loads. After the overall characterization of the machine, first successful results were generated based on 400 mum solder balls on micro BGA-package stressed under -40degC and +125degC conditions. A force drop down to approx. 60% of initial force at the first cycles was measured. The measured forces kept in a steady state ranged over approx. 80% of lifetime until the material mechanically failed. The main tasks planned to be solved are the direct measurement of degradation of solder alloys for comparison purpose, the determination of solder material fatigue behaviour and derived material fatigue laws.
  • Keywords
    ball grid arrays; fatigue; fatigue testing; materials testing; microcracks; plastic deformation; solders; thermomechanical treatment; BGA package; degradation behaviour; fatigue; in-situ force measurement; micro cracks; plastic deformation; real solder joints; solder alloys; solder balls; solder material matrix; temperature -40 degC; temperature 125 degC; thermal cycling loads; thermal cycling test; thermo-mechanical test method; Character generation; Fatigue; Force measurement; Plastics; Soldering; Testing; Thermal degradation; Thermal force; Thermal loading; Thermomechanical processes; LCF; degradation; fatigue; force drop; material; solder;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Packaging Conference, 2009. EMPC 2009. European
  • Conference_Location
    Rimini
  • Print_ISBN
    978-1-4244-4722-0
  • Electronic_ISBN
    978-0-6152-9868-9
  • Type

    conf

  • Filename
    5272925