• DocumentCode
    503189
  • Title

    Correlation between material selection and moisture sensitivity levels of quad flat no-lead (QFN) packages

  • Author

    Zhang, Minshu ; Lee, S. W Ricky ; Zhang, Jack ; Yun, Howard ; Starkey, Dale ; Chau, Hung

  • Author_Institution
    Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2009
  • fDate
    15-18 June 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Moisture sensitivity level (MSL) test is the well-known industrial standard to classify the level of moisture sensitivity of plastic packages. However, except for the classification, MSL test provides no suggestion for improving package MSL performance from the package design point of view. In order to achieve an expected MSL performance, further investigation of the correlation between package MSL and material selection is required. Based on this major objective, four kinds of molding compounds and two types of die attach materials were studied in this paper. Commercial 4times4 quad flat no-lead (QFN) packages were fabricated as the test vehicle. The stress ratio criterion was employed to evaluate the failure of 4times4 QFNs under MSL-1 tests. In addition, MSL-1 tests and related failure analysis were implemented to provide the experimental results. From the comparison between the stress ratio analysis and the experimental results, it is concluded that the molding compound with lower adhesion strength and higher Young´s modulus may lead to higher risk of delamination.
  • Keywords
    Young´s modulus; adhesion; delamination; failure analysis; moulding; plastic packaging; MSL-1 tests; QFN packages; Young´s modulus; adhesion strength; delamination; failure analysis; material selection; moisture sensitivity levels; molding compounds; plastic packages; quad flat no-lead packages; stress ratio analysis; Adhesives; Failure analysis; Microassembly; Moisture; Plastic packaging; Plastics industry; Risk analysis; Stress; Testing; Vehicles; C-SAM inspection; MSL test; QFN; button shear test; stress ratio criterion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Packaging Conference, 2009. EMPC 2009. European
  • Conference_Location
    Rimini
  • Print_ISBN
    978-1-4244-4722-0
  • Electronic_ISBN
    978-0-6152-9868-9
  • Type

    conf

  • Filename
    5272953