Title :
Far-end maximum crosstalk for coupled lines as function of load
Author :
Owzar, Amir ; Stephan, Ralph ; Petersen, Wesley ; Helfenstein, Markus
Author_Institution :
Stericsson, Switzerland
Abstract :
The move to 45 nm technology has seen a further reduction in the noise margin for CMOS devices. This has resulted in severe constraints on crosstalk between adjacent lines on the SIP (System-In-Package) substrate. The known formula in the literature for calculation of crosstalk between two coupled lines includes only the impact of the driver impedance but not the impact of the load capacitance. In this paper a formula has been developed to calculate the amplitude of coupled noise between two adjacent signal lines as a function of load capacitance.
Keywords :
CMOS integrated circuits; crosstalk; driver circuits; integrated circuit noise; system-in-package; CMOS devices; circuit noise margin; coupled lines; driver impedance; far-end maximum crosstalk; load capacitance; system-in-package substrate; CMOS technology; Capacitance; Crosstalk; Dielectric materials; Frequency; Impedance; Noise level; Noise reduction; SPICE; Voltage; SIP; coupled lines; crosstalk; driver impedance; load capacitance;
Conference_Titel :
Microelectronics and Packaging Conference, 2009. EMPC 2009. European
Conference_Location :
Rimini
Print_ISBN :
978-1-4244-4722-0
Electronic_ISBN :
978-0-6152-9868-9
