Control system of the laser topographer

Universal apparatus for measuring photoluminescence (PL) over surface of semiconductor samples was designed and realized. It enables to obtain photoluminescence intensity distribution PL(x,y) across the investigated sample for preselected wavelength lambda as well as the spectral distribution PL(lambda) for a fixed position (x,y) on the sample surface. The PC controlled equipment consists of a composite optical setup, micromanipulators, and electric circuits serving to extract relevant signal from the noisy background.