Title :
Resonator measurements of superonductor surface impedance provided oscillations degeneration removal
Author :
Barannik, Alexander A. ; Glamazdin, V.V. ; Skresanov, V.N. ; Cherpak, N.T.
Author_Institution :
A. Usikov Inst. of Radio Phys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkiv, Ukraine
Abstract :
The processing technique of amplitude-frequency response (AFR) of resonators with partial removal of mode of degeneration was developed, which allows calculating of resonance frequency and quality-factor. The approach was used for data processing obtained at AFR measurement of sapphire resonator with HTS film as a key stage of determination of surface impedance.
Keywords :
electric impedance measurement; frequency response; high-temperature superconductors; oscillations; sapphire; superconducting resonators; superconducting thin films; surface impedance; AFR measurement; Al2O3; HTS film; amplitude-frequency response; data processing; oscillation degeneration removal; resonance frequency; resonator measurement; sapphire resonator; superconductor surface impedance; Helium; IEEE catalog; Impedance measurement; Indium tin oxide; Organizing; Surface impedance;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
