Microwave complex for the measurement of anisotropic dielectrics´ parameters

A measurement complex is developed which exhibits the following characteristics: availability of low-level microwave power used for the measurements. This feature renders possible nondestructive testing of the required parameters. High speed of both gaging and the sample changing. Ability of full automatic performance and inclusion into production runs. It can be used to carry out the following measurements of: permittivity of isotropic dielectrics. Permittivity of tensor components of anisotropic dielectrics. Losses of electromagnetic energy. Principal directions and optical axes of monaxonic and biaxial crystals.