Title :
Measurement of microwave device noise figure
Author :
Belchikov, S.A. ; Dzisiak, A.B.
Author_Institution :
T&M Group, ELVIRA Production Co. Ltd., Zheleznodorozhny, Russia
Abstract :
The main methods of measurement of noise figure of microwave devices are reviewed. The new possibilities of the spectrum analyzer CK4-Belan 32 are shown.
Keywords :
microwave devices; microwave measurement; noise; spectral analysers; CK4-Belan 32 spectrum analyzer; microwave device noise figure measurement; Helium; IEEE catalog; Microwave devices; Microwave measurements; Microwave technology; Noise figure; Noise measurement; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
