DocumentCode
503398
Title
Influence of design and technological factors on radiation stability of bipolar and MDS integration chips
Author
Alekseev, V.F. ; Piskoon, G.A.
Author_Institution
Belarusian State Univ. of Inf. & Radioelectron., Minsk, Belarus
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
724
Lastpage
725
Abstract
Information about destabilizing influence of radiation on operational integrity of hi-tech bipolar integrated circuits and MDS-circuits is presented. Experimentally received data of sensibility to ionization radiation IC, produced by means of five different technologies.
Keywords
bipolar integrated circuits; circuit stability; integrated circuit design; microprocessor chips; microwave integrated circuits; MDS integration chip; bipolar integrated circuit ionization radiation stability; Helium; IEEE catalog; Isolation technology; Microwave technology; Organizing; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-4796-1
Type
conf
Filename
5292901
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