Title :
Influence of design and technological factors on radiation stability of bipolar and MDS integration chips
Author :
Alekseev, V.F. ; Piskoon, G.A.
Author_Institution :
Belarusian State Univ. of Inf. & Radioelectron., Minsk, Belarus
Abstract :
Information about destabilizing influence of radiation on operational integrity of hi-tech bipolar integrated circuits and MDS-circuits is presented. Experimentally received data of sensibility to ionization radiation IC, produced by means of five different technologies.
Keywords :
bipolar integrated circuits; circuit stability; integrated circuit design; microprocessor chips; microwave integrated circuits; MDS integration chip; bipolar integrated circuit ionization radiation stability; Helium; IEEE catalog; Isolation technology; Microwave technology; Organizing; Stability;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
