DocumentCode
503404
Title
Forecasting ic stability at the effect of power pulse electromagnetic field
Author
Glumova, M.V. ; Gribskij, M.P. ; Grigorev, E.V. ; Starostenko, V.V. ; Taran, E.P. ; Unzhakov, D.A.
Author_Institution
Taurida Nat. Univ. V. I. Vernadsky, Simferopol, Ukraine
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
736
Lastpage
737
Abstract
The results of predictive modeling of resistability of modern microcircuits at influence of powerful pulse electromagnetic fields on the basis of experimental data and numerically-analytical model are discussed.
Keywords
electromagnetic fields; field effect integrated circuits; IC stability forecasting; microcircuits; power pulse electromagnetic field; predictive modeling; Circuits; EMP radiation effects; Electromagnetic fields; Helium; Indium tin oxide; RNA; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-4796-1
Type
conf
Filename
5292907
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