Title :
Scanners for near-field microwave microscopy
Author :
Derkach, V.N. ; Golovashchenko, R.V. ; Goroshko, O.V. ; Korzh, V.G. ; Anbinderis, T. ; Laurinavicius, A.
Author_Institution :
Usikov Inst. of Radiophys. & Electron., NAS of Ukraine, Kharkov, Ukraine
Abstract :
The description of methods and facilities of microwave near-field microscopy and the radiophysical equipment designed within the framework of scientific and technical cooperation is given. The results of model experiments, amplitude and phase pictures of optically opaque objects by using the near-field technique are considered at frequencies of (40...140) GHz.
Keywords :
microwave measurement; scanning probe microscopy; amplitude pictures; frequency 40 GHz to 140 GHz; microwave microscopy; near-field microwave microscopy; optically opaque objects; phase pictures; radiophysical equipment design; scanners; Diffraction gratings; Helium; IEEE catalog; Microscopy; Organizing; Physics;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
