DocumentCode :
503616
Title :
Certain cause of hidden deterioration of magnetron efficiency
Author :
Gurko, A.A. ; Yeryomka, V.D.
Author_Institution :
Joint Stock Co. Pluton, Moscow, Russia
fYear :
2009
fDate :
14-18 Sept. 2009
Firstpage :
194
Lastpage :
195
Abstract :
A technique for parameter checking of oscillatory system of a magnetron is proposed, enabling to determine the cause of appearing of internal defects in the production of oscillators. It is shown that the ways of indirect estimation of "destruction" of spectrum of spatial harmonics of a HF field of a slow-wave structure of anode of magnetron make it possible to minimize the risk of appearing of internal defects, which result from the defects of its oscillatory system.
Keywords :
magnetrons; oscillators; HF field spatial harmonics spectrum; hidden deterioration; magnetron anode; magnetron efficiency; oscillatory system parameter checking; slow-wave structure; Committee on Technology Accreditation Activities; Helium; IEEE catalog; Microwave technology; Organizing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
Type :
conf
Filename :
5293153
Link To Document :
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