DocumentCode
503616
Title
Certain cause of hidden deterioration of magnetron efficiency
Author
Gurko, A.A. ; Yeryomka, V.D.
Author_Institution
Joint Stock Co. Pluton, Moscow, Russia
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
194
Lastpage
195
Abstract
A technique for parameter checking of oscillatory system of a magnetron is proposed, enabling to determine the cause of appearing of internal defects in the production of oscillators. It is shown that the ways of indirect estimation of "destruction" of spectrum of spatial harmonics of a HF field of a slow-wave structure of anode of magnetron make it possible to minimize the risk of appearing of internal defects, which result from the defects of its oscillatory system.
Keywords
magnetrons; oscillators; HF field spatial harmonics spectrum; hidden deterioration; magnetron anode; magnetron efficiency; oscillatory system parameter checking; slow-wave structure; Committee on Technology Accreditation Activities; Helium; IEEE catalog; Microwave technology; Organizing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-4796-1
Type
conf
Filename
5293153
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