• DocumentCode
    50366
  • Title

    A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

  • Author

    Ahmed, Toufik ; Jun Yao ; Nakashima, Yuta

  • Author_Institution
    Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1567
  • Lastpage
    1574
  • Abstract
    Partial redundancy is a method to address errors from single event effects (SEEs) on critical data while leaving less important data unprotected for energy consumption trade-offs. Under a low SEE rate, the method can provide a good cost-effective fault tolerance, while many silent data corruptions (SDCs) may occur under a high fault rate due to an incomplete fault coverage. This paper proposes a system-level approach to additionally covering SDCs in a partial redundancy by a light-weighted error prediction. Our results from a simulation under a stress radiation test condition show that with an average 8% cost in energy consumption, we can reduce the SDC rate from 12% to 0.37%, for the work loads that we studied.
  • Keywords
    radiation hardening (electronics); redundancy; SDC prediction; energy consumption trade-offs; fault tolerance; partial redundancy; radiation stress test; robustness; silent data corruptions; single event effects; Arrays; Energy consumption; Error analysis; Indexes; Redundancy; Energy consumption; fault tolerance; redundancy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2314691
  • Filename
    6832653