• DocumentCode
    503665
  • Title

    Computer-aided measurements and rejection of high power microwave transistors on a wafer

  • Author

    Galdetskiy, A.V. ; Vorobiev, A.A.

  • Author_Institution
    FSUE Istok, Fryazino, Russia
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    95
  • Lastpage
    96
  • Abstract
    A computer-aided set-up and software are developed for characterization and rejecting of high power microwave transistors on a wafer. To overcome spurious oscillations and increase the accuracy of measurements a special multipin probe is fabricated. The developed software gives opportunities to realize complicated scripts of measurements and testing.
  • Keywords
    computerised instrumentation; electronic engineering computing; microwave transistors; oscillations; wafer-scale integration; computer-aided measurements; computer-aided set-up; high power microwave transistors; multipin probe; spurious oscillations; wafer; Gallium arsenide; Helium; IEEE catalog; Microwave measurements; Microwave transistors; Organizing; Power measurement; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-4796-1
  • Type

    conf

  • Filename
    5293212
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=503665