Title :
T-matching networks for the efficient matching of practical RFID tags
Author :
Choo, J. ; Ryoo, J. ; Hong, J. ; Jeon, H. ; Choi, C. ; Tentzeris, Manos M.
Author_Institution :
RFID Res. Lab., LS Ind. Syst., Anyang, South Korea
fDate :
Sept. 29 2009-Oct. 1 2009
Abstract :
In this paper, we study T-matching networks that are commonly used for the efficient matching of UHF tags. In order to analyze relationship between T-matching geometry and antenna impedance, we interpret the transformer circuit as an equivalent circuit depending on the design parameters of the circuit. From the parametric study of the T-matching, we derive an optimized topology which is able to overcome electrically change of the geometry resulted from material loading. Next, based on the previous study, we design two types of tag antennas for practical item-level RFID applications that require the discrimination different objects. We calculate theoretically the minimum operating power of tags based on the computed antenna characteristics, antenna impedance, directivity, efficiency, regarding various dielectric constants. To verify the performance of the developed tags in practical conditions, we measure the minimum required power to activate tags on multiple objects in conjunction with commercial measurement system. As a result, the designed tags present almost consistent readability on materials from low to high dielectric constant. Thus, the results clearly verify that the appropriate T-matching geometry provides consistent readability in practical UHF RFID tags.
Keywords :
UHF antennas; equivalent circuits; radiofrequency identification; transformers; T-matching geometry; T-matching networks; UHF tags; antenna characteristics; antenna impedance; dielectric constant; equivalent circuit; practical RFID tags; transformer circuit; Antenna measurements; Antenna theory; Circuits; Dielectric materials; Dielectric measurements; Geometry; Impedance; Power measurement; RFID tags; UHF measurements;
Conference_Titel :
Microwave Conference, 2009. EuMC 2009. European
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4748-0