Title : 
New Reliability-Based Robust Design Optimization Algorithms for Electromagnetic Devices Utilizing Worst Case Scenario Approximation
         
        
            Author : 
Ziyan Ren ; Dianhai Zhang ; Chang-Seop Koh
         
        
            Author_Institution : 
Coll. of Electr. & Comput. Eng., Chungbuk Nat. Univ., Cheongju, South Korea
         
        
        
        
        
        
        
        
            Abstract : 
In order to deal with main targets of design methodologies subject to uncertainties in design variables: reliability and robustness, the reliability-based robust design optimization (RBRDO) is developed by integrating the performance robustness and constraint feasibility into a single optimization model. A new RBRDO algorithm is proposed based on the worst case scenario approximation for robustness assessment and the sensitivity-assisted Monte Carlo simulation method for effective reliability calculation. Furthermore, one multi-objective RBRDO formulation is suggested. Overall, an electromagnetic application-superconducting magnetic energy storage device (TEAM Problem 22) is used to investigate performances of the proposed RBRDO methods.
         
        
            Keywords : 
Monte Carlo methods; electromagnetic devices; magnetic storage; optimisation; reliability; superconducting magnet energy storage; RBRDO algorithm; constraint feasibility; design methodology; design variables; electromagnetic application-superconducting magnetic energy storage device; electromagnetic devices; multiobjective RBRDO formulation; performance robustness; reliability calculation; reliability-based robust design optimization algorithms; robustness assessment; sensitivity-assisted Monte Carlo simulation method; single optimization model; worst case scenario approximation; Constraint feasibility; performance robustness; reliability-based robust design optimization; sensitivity-assisted Monte Carlo simulation; worst case scenario approximation;
         
        
        
            Journal_Title : 
Magnetics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TMAG.2013.2238906