DocumentCode
504989
Title
Anti-saturation surface topography observer for amplitude modulation atomic force microscope
Author
Shiraishi, Takayuki ; Fujimoto, Hiroshi
Author_Institution
Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
fYear
2009
fDate
18-21 Aug. 2009
Firstpage
23
Lastpage
28
Abstract
This paper addresses the development of amplitude modulation atomic force microscopes (AM-AFM). The output of the AM-AFM is obtained from amplitude demodulation of the excited cantilever tip position. Thus, when the amplitude of the cantilever tip position is zero or maximum value, the output will be saturated. The output saturation prevents disturbance suppression. In this paper, the anti-saturation surface topography observer which improves the output saturation is proposed. The proposed method estimates the unsaturated output and uses it for the feedback loop. Finally, effectiveness of a proposed method is shown by simulation and experimental results.
Keywords
amplitude modulation; atomic force microscopy; feedback; microscopes; observers; amplitude demodulation; amplitude modulation atomic force microscope; anti-saturation surface topography observer; cantilever tip position; disturbance suppression; feedback loop; output saturation; Actuators; Amplitude modulation; Atomic force microscopy; Atomic measurements; Biological materials; Demodulation; Force measurement; Nanobioscience; Nanoscale devices; Surface topography; Atomic force microscope; Dynamic mode AFM; Nanoscale servo control; Observer; Saturatio;
fLanguage
English
Publisher
ieee
Conference_Titel
ICCAS-SICE, 2009
Conference_Location
Fukuoka
Print_ISBN
978-4-907764-34-0
Electronic_ISBN
978-4-907764-33-3
Type
conf
Filename
5335095
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