DocumentCode :
504989
Title :
Anti-saturation surface topography observer for amplitude modulation atomic force microscope
Author :
Shiraishi, Takayuki ; Fujimoto, Hiroshi
Author_Institution :
Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
fYear :
2009
fDate :
18-21 Aug. 2009
Firstpage :
23
Lastpage :
28
Abstract :
This paper addresses the development of amplitude modulation atomic force microscopes (AM-AFM). The output of the AM-AFM is obtained from amplitude demodulation of the excited cantilever tip position. Thus, when the amplitude of the cantilever tip position is zero or maximum value, the output will be saturated. The output saturation prevents disturbance suppression. In this paper, the anti-saturation surface topography observer which improves the output saturation is proposed. The proposed method estimates the unsaturated output and uses it for the feedback loop. Finally, effectiveness of a proposed method is shown by simulation and experimental results.
Keywords :
amplitude modulation; atomic force microscopy; feedback; microscopes; observers; amplitude demodulation; amplitude modulation atomic force microscope; anti-saturation surface topography observer; cantilever tip position; disturbance suppression; feedback loop; output saturation; Actuators; Amplitude modulation; Atomic force microscopy; Atomic measurements; Biological materials; Demodulation; Force measurement; Nanobioscience; Nanoscale devices; Surface topography; Atomic force microscope; Dynamic mode AFM; Nanoscale servo control; Observer; Saturatio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ICCAS-SICE, 2009
Conference_Location :
Fukuoka
Print_ISBN :
978-4-907764-34-0
Electronic_ISBN :
978-4-907764-33-3
Type :
conf
Filename :
5335095
Link To Document :
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