• DocumentCode
    504989
  • Title

    Anti-saturation surface topography observer for amplitude modulation atomic force microscope

  • Author

    Shiraishi, Takayuki ; Fujimoto, Hiroshi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
  • fYear
    2009
  • fDate
    18-21 Aug. 2009
  • Firstpage
    23
  • Lastpage
    28
  • Abstract
    This paper addresses the development of amplitude modulation atomic force microscopes (AM-AFM). The output of the AM-AFM is obtained from amplitude demodulation of the excited cantilever tip position. Thus, when the amplitude of the cantilever tip position is zero or maximum value, the output will be saturated. The output saturation prevents disturbance suppression. In this paper, the anti-saturation surface topography observer which improves the output saturation is proposed. The proposed method estimates the unsaturated output and uses it for the feedback loop. Finally, effectiveness of a proposed method is shown by simulation and experimental results.
  • Keywords
    amplitude modulation; atomic force microscopy; feedback; microscopes; observers; amplitude demodulation; amplitude modulation atomic force microscope; anti-saturation surface topography observer; cantilever tip position; disturbance suppression; feedback loop; output saturation; Actuators; Amplitude modulation; Atomic force microscopy; Atomic measurements; Biological materials; Demodulation; Force measurement; Nanobioscience; Nanoscale devices; Surface topography; Atomic force microscope; Dynamic mode AFM; Nanoscale servo control; Observer; Saturatio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ICCAS-SICE, 2009
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-4-907764-34-0
  • Electronic_ISBN
    978-4-907764-33-3
  • Type

    conf

  • Filename
    5335095