DocumentCode :
50500
Title :
Interview with Art Cohen at the 2014 IEEE International Symposium on EMC
Volume :
4
Issue :
1
fYear :
2015
fDate :
1st Quarter 2015
Firstpage :
36
Lastpage :
41
Abstract :
Presents an interview conducted with Art Cohen at the 2014 IEEE International Symposium on EMC.
Keywords :
Interviews;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2264
Type :
jour
DOI :
10.1109/MEMC.2015.7098469
Filename :
7098469
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=50500
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