DocumentCode
50500
Title
Interview with Art Cohen at the 2014 IEEE International Symposium on EMC
Volume
4
Issue
1
fYear
2015
fDate
1st Quarter 2015
Firstpage
36
Lastpage
41
Abstract
Presents an interview conducted with Art Cohen at the 2014 IEEE International Symposium on EMC.
Keywords
Interviews;
fLanguage
English
Journal_Title
Electromagnetic Compatibility Magazine, IEEE
Publisher
ieee
ISSN
2162-2264
Type
jour
DOI
10.1109/MEMC.2015.7098469
Filename
7098469
Link To Document