Title :
Introduction of recent activity on IEC/SC65E
Author_Institution :
Integrated Control Syst. Dept. I, Fuji Electr. Syst., Tokyo, Japan
Abstract :
This paper introduces of the activity of IEC/SC65E to prepare international standards to specify digital representation of device properties and functions, methodologies and applications supporting automation of engineering processes, including diagnostic and maintenance techniques.
Keywords :
IEC standards; automation; control engineering computing; data structures; IEC/SC65E activity; automation support applications; device function; device properties digital representation; diagnostic technique; engineering process; international standard; maintenance technique; Automation; Computer architecture; Documentation; IEC standards; ISO standards; Industrial control; Inventory management; Measurement standards; Process control; Quality management; 61804; 61987; 62264; 62453; 62541; EDDL (Electronic Device Description Language ); FDT(Field Device Tool); OPC(OLE for Process Control); device profile; diagnostic; enterprise system; function block; maintenance;
Conference_Titel :
ICCAS-SICE, 2009
Conference_Location :
Fukuoka
Print_ISBN :
978-4-907764-34-0
Electronic_ISBN :
978-4-907764-33-3
