DocumentCode :
505426
Title :
Development of a reliable low cost NMOS process for microfabrication courses and proof-of-concepts in research
Author :
Berube, Benoit-Louis ; Charlebois, Serge A.
Author_Institution :
D??partement de g??nie ??lectrique et de g??nie informatique et, Centre d´excellence en g??nie de l´information, Universit?? de Sherbrooke, (Qu??bec), Canada
fYear :
2009
fDate :
13-14 Oct. 2009
Firstpage :
116
Lastpage :
119
Abstract :
We present a low cost NMOS technology designed to support undergraduate and graduate microfabrication and device physics courses. This 6 mask process is intended to be reliably fabricated in a broad access university facility using undedicated equipment. One set of cells has been designed for process characterization (including statistical analysis) and device physics analysis. A second set of cells comprises basic logic gates, binary counters and analog circuit elements including an operational amplifier. In addition to teaching purposes, the technology aims at enabling the integration of Si electronic technologies (either as control or as front-end electronic) with other technologies such as single electronics (SET), biosensors and MEMS. This is accomplished by allowing the NMOS process to be done either before or after the other technology of interest which cannot be done using commercial Si processes.
Keywords :
NMOS; electrical characterization; microfabrication; statistical failiure analysis; teaching;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Microsystems and Nanoelectronics Research Conference, 2009. MNRC 2009. 2nd
Conference_Location :
Ottawa, ON, Canada
Print_ISBN :
978-1-4244-4751-0
Type :
conf
Filename :
5338945
Link To Document :
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