DocumentCode :
505473
Title :
Numerical simulation of complex submicron devices with experimentally determined power maps
Author :
Raad, Peter E. ; Burzo, Mihai G. ; Komarov, Pavel L.
Author_Institution :
IEEE Conference Publishing, Southern Methodist Univ., Plano, TX, USA
fYear :
2009
fDate :
7-9 Oct. 2009
Firstpage :
36
Lastpage :
39
Abstract :
Both computational and experimental methods play a key role in thermal characterization, particularly in prototyping and design with each having their own set of strengths and weakness. In this work the authors demonstrate that simulation methods can provide temperature information in three spatial dimensions and in critical regions that are inaccessible to measurement tools. Combining the complementary tools of experimentation and simulation can leverage their respective strengths and create a coupled approach that is vastly more powerful than either tool alone.
Keywords :
integrated circuit modelling; integrated circuit packaging; thermal management (packaging); complex submicron device simulation; microelectronic devices; power maps; thermal characterization; Computational modeling; Electronics cooling; Impedance; Moore´s Law; Numerical simulation; Power distribution; Prototypes; Publishing; Spatial resolution; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
Conference_Location :
Leuven
Print_ISBN :
978-1-4244-5881-3
Type :
conf
Filename :
5340049
Link To Document :
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