• DocumentCode
    505488
  • Title

    Evaluation of materials for high temperature IC packaging

  • Author

    Klieber, Robert ; Lerch, Renee

  • Author_Institution
    Fraunhofer Inst. for Microelectron. Circuits & Syst., Duisburg, Germany
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    Fast decrease of device dimensions, rapid growth of the number of elements per integrated circuit device (IC) and the increasing amount of interconnections between the chip and the substrate lead to a more complex design and production of the ICs and to higher demands towards packaging technology as well. This is especially true in the field of high temperature electronics with operating temperatures of up to 250degC. We present an evaluation of materials for both the adhesive and the encapsulant for packaging of high temperature ICs for this temperature range. Among the available materials only glass-based formulations could withstand extended periods of heat and substantial numbers of temperature cycles. In addition, samples of high temperature CMOS ICs (capacitive pressure sensors and EEPROMs) have been successfully assembled using these materials.
  • Keywords
    CMOS memory circuits; EPROM; adhesives; capacitive sensors; encapsulation; glass; high-temperature electronics; integrated circuit packaging; integrated circuit reliability; microassembling; polymers; pressure sensors; EEPROM; SiO2; adhesive materials; capacitive pressure sensors; die attach; encapsulant materials; epoxies; glass-based materials; high temperature CMOS IC; high temperature IC packaging; polyimides; reliability; temperature 250 degC; Assembly; Capacitive sensors; EPROM; Electronics packaging; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Production; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
  • Conference_Location
    Leuven
  • Print_ISBN
    978-1-4244-5881-3
  • Type

    conf

  • Filename
    5340065