DocumentCode :
505514
Title :
Failure detection with HMM waveforms
Author :
Muhonen, Kathleen ; Dunnihoo, Jeffrey ; Grund, Evan ; Peachey, Nate ; Brankov, Anguel
Author_Institution :
Behrend Coll., Penn State Erie, Erie, PA, USA
fYear :
2009
fDate :
Aug. 30 2009-Sept. 4 2009
Firstpage :
1
Lastpage :
9
Abstract :
HMM data illustrates the usefulness of collecting current pulse waveforms during HMM testing. Waveforms revealed failures before leakage measurements would show device failure. With capacitively coupled devices, Time Domain Reflectometry, (TDR), can be used to detect part failures in addition to extracting this information from HMM pulse waveforms.
Keywords :
electric impedance measurement; electrostatic discharge; failure analysis; time-domain reflectometry; HMM pulse waveforms; HMM testing; capacitively coupled devices; failure detection; human metal model waveforms; time domain reflectometry; Circuit testing; Electrostatic discharge; Guns; Hidden Markov models; IEC standards; Impedance measurement; Pulse generation; Pulse measurements; Reflectometry; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
Type :
conf
Filename :
5340101
Link To Document :
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