DocumentCode
505526
Title
HBM cross power domain failure due to secondary tester pulse
Author
Jack, Nathan ; Davis, James ; Chaine, Michael ; Rosenbaum, Elyse
Author_Institution
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2009
fDate
Aug. 30 2009-Sept. 4 2009
Firstpage
1
Lastpage
7
Abstract
A cross power domain failure, caused by the secondary pulse produced by HBM testers, is presented. Previous works report damage due to ldquotrailing pulserdquo EOS, but this failure is caused by the second discharge which occurs when the relay achieves mechanical continuity. ESD paths which are not transiently triggered can protect against this stress.
Keywords
electrostatic discharge; failure analysis; relays; ESD paths; HBM cross power domain failure; HBM testers; human body model; mechanical continuity; relay; second discharge; secondary tester pulse; stress; trailing pulse EOS; Circuits; Clamps; Earth Observing System; Electrostatic discharge; Protection; Relays; Stress; Testing; Variable structure systems; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
EOS/ESD Symposium, 2009 31st
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-176-1
Electronic_ISBN
978-1-58537-176-1
Type
conf
Filename
5340113
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