Title :
HBM cross power domain failure due to secondary tester pulse
Author :
Jack, Nathan ; Davis, James ; Chaine, Michael ; Rosenbaum, Elyse
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
A cross power domain failure, caused by the secondary pulse produced by HBM testers, is presented. Previous works report damage due to ldquotrailing pulserdquo EOS, but this failure is caused by the second discharge which occurs when the relay achieves mechanical continuity. ESD paths which are not transiently triggered can protect against this stress.
Keywords :
electrostatic discharge; failure analysis; relays; ESD paths; HBM cross power domain failure; HBM testers; human body model; mechanical continuity; relay; second discharge; secondary tester pulse; stress; trailing pulse EOS; Circuits; Clamps; Earth Observing System; Electrostatic discharge; Protection; Relays; Stress; Testing; Variable structure systems; Voltage;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
