DocumentCode
505540
Title
FCDM measurements of small devices
Author
Johnson, M. ; Ashton, R. ; Ward, S.
Author_Institution
Nat. Semicond. Corp, Santa Clara, CA, USA
fYear
2009
fDate
Aug. 30 2009-Sept. 4 2009
Firstpage
1
Lastpage
8
Abstract
Peak current measurements using high bandwidth oscilloscopes show that even small packages exhibit high amplitude FCDM currents. The effects of support templates and vacuum holes on the measured FCDM current waveform are discussed and analyzed, along with other challenges of FCDM stressing small footprint devices.
Keywords
electrostatic devices; oscilloscopes; FCDM current waveform; FCDM measurements; field induced charged device model; high bandwidth oscilloscopes; peak current measurements; small footprint devices; support templates; vacuum holes; Bandwidth; Circuit testing; Current measurement; Electrostatic discharge; Instruments; Oscilloscopes; Packaging; Semiconductor device testing; Stress measurement; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
EOS/ESD Symposium, 2009 31st
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-176-1
Electronic_ISBN
978-1-58537-176-1
Type
conf
Filename
5340127
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