Title :
Accurate transient behavior measurement of high-voltage ESD protections based on a very fast transmission-line pulse system
Author :
Delmas, Antoine ; Trémouilles, David ; Nolhier, Nicolas ; Bafleur, Marise ; Mauran, Nicolas ; Gendron, Amaury
Author_Institution :
LAAS, CNRS, Toulouse, France
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
A comprehensive study of the limitations of vf-TLP setup for transient measurements is exposed. A new method, based on a numerical correction of measured data using a commercial Oryx vf-TLP system is presented. It allows the measurement of ESD pulses up to 1000 V with a time resolution down to 60 ps.
Keywords :
electrostatic discharge; high-voltage techniques; protection; transient analysis; transients; ESD pulse measurement; Oryx vf-TLP system; high-voltage ESD protection; numerical correction; transient measurement; very fast transmission-line pulse system; voltage 1000 V; Current measurement; Electrostatic discharge; Oscilloscopes; Probes; Protection; Pulse measurements; Time measurement; Transient analysis; Transmission lines; Voltage;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
