Title :
Origins of EOS in manufacturing environment and its classification
Author_Institution :
3M Co., Soquel, CA, USA
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
EOS (Electric Overstress) is a serious threat to defect-free manufacturing, long-term product reliability and interruption-free manufacturing process. This paper summarizes the sources of EOS, its impact on production and suggests classification of EOS occurrences into models in a similar fashion to ESD Events.
Keywords :
electrostatic discharge; reliability; EOS; ESD event; electric overstress; electrostatic discharge event; interruption-free manufacturing process; long-term product reliability; Assembly; Earth Observing System; Electrostatic discharge; Floods; Manufacturing processes; Nanoscale devices; Power generation; Predictive models; Production; Voltage control;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
