Title :
Minimizing photodiode nonlinearities by compensating voltage-dependent responsivity effects
Author :
Hastings, Alexander S. ; Tulchinsky, David A. ; Williams, Keith J. ; Pan, Huapu ; Beling, Andreas ; Campbell, Joe C.
Author_Institution :
Photonics Technol. Branch, Naval Res. Lab., Washington, DC, USA
Abstract :
Two voltage-dependant responsivity effects, impact ionization and Franz-Keldysh oscillations, are shown to have opposing effects at certain wavelengths in p-i-n photodiodes. It is shown that these two effects can compensate each other and minimize photodiode nonlinearities when optimized with respect to wavelength and bias voltage.
Keywords :
impact ionisation; oscillations; p-i-n photodiodes; Franz-Keldysh oscillations; impact ionization; p-i-n photodiodes; photodiode nonlinearities; voltage-dependent responsivity; Charge carrier processes; Distortion measurement; Impact ionization; Indium gallium arsenide; Optical distortion; PIN photodiodes; Photoconductivity; Power measurement; Voltage; Wavelength measurement;
Conference_Titel :
Microwave Photonics, 2009. MWP '09. International Topical Meeting on
Conference_Location :
Valencia
Print_ISBN :
978-1-4244-4788-6
