DocumentCode :
506425
Title :
ITTW: T-way minimization strategy based on intersection of tuples
Author :
Younis, Mohammed I. ; Zamli, Kamal Z.
Author_Institution :
Sch. of Electr. & Electron., Univ. Sains Malaysia, Nibong Tebal, Malaysia
Volume :
1
fYear :
2009
fDate :
4-6 Oct. 2009
Firstpage :
221
Lastpage :
226
Abstract :
Despite being an important activity in the software development cycle (i.e. to ensure quality and reliability), exhaustive testing is prohibitively impossible. Systematic minimization strategy based on coverage or t-way parameter interactions are often sought for to help minimize the test space. Unlike coverage based minimization strategy which takes a white box approach, t-way parameter interactions based strategy (i.e. termed t-way testing) takes a black box approach in the sense that no information regarding the implementation is required to perform the reduction. Instead, t-way testing strategy solely relies on parameter interactions between input variables. Building from earlier work, this paper proposes a new strategy, called ITTW, to minimize the number of test set using the intersection of t-way tuples. In doing so, this paper also demonstrates the correctness of the ITTW strategy. Additionally, this paper also compares ITTW strategy against existing strategies, namely: IPOG, IPOD, IPOF, IPOF2, ITCH, Jenny, TVGII, and TConfig. The results demonstrate that ITTW, in most cases, outperforms other existing strategies in terms of test size and execution time.
Keywords :
program testing; software engineering; ITTW strategy; exhaustive testing; software development cycle; systematic minimization; t-way minimization; t-way testing; tuples intersection; white box approach; Application software; Automatic testing; Electronic equipment testing; Industrial electronics; Input variables; Performance evaluation; Portable media players; Programming; Software testing; System testing; Multiway Testing; Pairwise Testing; Test Plan Data Generation; t-way Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics & Applications, 2009. ISIEA 2009. IEEE Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-4681-0
Electronic_ISBN :
978-1-4244-4683-4
Type :
conf
DOI :
10.1109/ISIEA.2009.5356469
Filename :
5356469
Link To Document :
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