• DocumentCode
    506425
  • Title

    ITTW: T-way minimization strategy based on intersection of tuples

  • Author

    Younis, Mohammed I. ; Zamli, Kamal Z.

  • Author_Institution
    Sch. of Electr. & Electron., Univ. Sains Malaysia, Nibong Tebal, Malaysia
  • Volume
    1
  • fYear
    2009
  • fDate
    4-6 Oct. 2009
  • Firstpage
    221
  • Lastpage
    226
  • Abstract
    Despite being an important activity in the software development cycle (i.e. to ensure quality and reliability), exhaustive testing is prohibitively impossible. Systematic minimization strategy based on coverage or t-way parameter interactions are often sought for to help minimize the test space. Unlike coverage based minimization strategy which takes a white box approach, t-way parameter interactions based strategy (i.e. termed t-way testing) takes a black box approach in the sense that no information regarding the implementation is required to perform the reduction. Instead, t-way testing strategy solely relies on parameter interactions between input variables. Building from earlier work, this paper proposes a new strategy, called ITTW, to minimize the number of test set using the intersection of t-way tuples. In doing so, this paper also demonstrates the correctness of the ITTW strategy. Additionally, this paper also compares ITTW strategy against existing strategies, namely: IPOG, IPOD, IPOF, IPOF2, ITCH, Jenny, TVGII, and TConfig. The results demonstrate that ITTW, in most cases, outperforms other existing strategies in terms of test size and execution time.
  • Keywords
    program testing; software engineering; ITTW strategy; exhaustive testing; software development cycle; systematic minimization; t-way minimization; t-way testing; tuples intersection; white box approach; Application software; Automatic testing; Electronic equipment testing; Industrial electronics; Input variables; Performance evaluation; Portable media players; Programming; Software testing; System testing; Multiway Testing; Pairwise Testing; Test Plan Data Generation; t-way Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics & Applications, 2009. ISIEA 2009. IEEE Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4681-0
  • Electronic_ISBN
    978-1-4244-4683-4
  • Type

    conf

  • DOI
    10.1109/ISIEA.2009.5356469
  • Filename
    5356469