DocumentCode
506425
Title
ITTW: T-way minimization strategy based on intersection of tuples
Author
Younis, Mohammed I. ; Zamli, Kamal Z.
Author_Institution
Sch. of Electr. & Electron., Univ. Sains Malaysia, Nibong Tebal, Malaysia
Volume
1
fYear
2009
fDate
4-6 Oct. 2009
Firstpage
221
Lastpage
226
Abstract
Despite being an important activity in the software development cycle (i.e. to ensure quality and reliability), exhaustive testing is prohibitively impossible. Systematic minimization strategy based on coverage or t-way parameter interactions are often sought for to help minimize the test space. Unlike coverage based minimization strategy which takes a white box approach, t-way parameter interactions based strategy (i.e. termed t-way testing) takes a black box approach in the sense that no information regarding the implementation is required to perform the reduction. Instead, t-way testing strategy solely relies on parameter interactions between input variables. Building from earlier work, this paper proposes a new strategy, called ITTW, to minimize the number of test set using the intersection of t-way tuples. In doing so, this paper also demonstrates the correctness of the ITTW strategy. Additionally, this paper also compares ITTW strategy against existing strategies, namely: IPOG, IPOD, IPOF, IPOF2, ITCH, Jenny, TVGII, and TConfig. The results demonstrate that ITTW, in most cases, outperforms other existing strategies in terms of test size and execution time.
Keywords
program testing; software engineering; ITTW strategy; exhaustive testing; software development cycle; systematic minimization; t-way minimization; t-way testing; tuples intersection; white box approach; Application software; Automatic testing; Electronic equipment testing; Industrial electronics; Input variables; Performance evaluation; Portable media players; Programming; Software testing; System testing; Multiway Testing; Pairwise Testing; Test Plan Data Generation; t-way Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics & Applications, 2009. ISIEA 2009. IEEE Symposium on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-4681-0
Electronic_ISBN
978-1-4244-4683-4
Type
conf
DOI
10.1109/ISIEA.2009.5356469
Filename
5356469
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