Title :
A new Shifted Scaled LS channel estimator for Rician flat fading MIMO channel
Author :
Nooralizadeh, Hamid ; Moghaddam, Shahriar Shirvani
Author_Institution :
Electr. Eng. Dept., Islamic Azad Univ., Tehran, Iran
Abstract :
In this paper, Training-Based Channel Estimation (TBCE) method is considered in the Rician flat fading Multiple-Input Multiple-Output (MIMO) channels. In this channel model, the performance of the conventional Least Squares (LS) channel estimator is probed first. A new shifted type of Scaled Least Squares (SLS) channel estimator, entitled as SSLS, is then proposed. It is a generalized form of the SLS technique. The optimal choice of training signals using Mean Square Error (MSE) criterion is also achieved. It is observed that the LS estimator cannot exploit the knowledge of channel statistics. However, the SSLS estimator exploits the trace of a specifically defined matrix of the channel covariance and the receiver noise power as well as the knowledge of first-order statistics about the channel. It is shown that in the Rician fading MIMO channel, the new channel estimator has better performance than the popular LS and SLS techniques. Theoretical analysis and simulation results demonstrate that increasing Rice factor is a reason for decreasing MSE of the proposed estimator.
Keywords :
MIMO communication; Rician channels; channel estimation; least squares approximations; mean square error methods; Rician flat fading MIMO channel; channel covariance; mean square error; multiple-input multiple-output channels; receiver noise power; shifted scaled least squares channel estimator; training-based channel estimation method; Analytical models; Channel estimation; Covariance matrix; Fading; Laser sintering; Least squares approximation; MIMO; Mean square error methods; Rician channels; Statistics; Multiple-Input Multiple-Output (MIMO); Rician Fading; Shifted Scaled Least Squares (SSLS); Training Based Channel Estimation;
Conference_Titel :
Industrial Electronics & Applications, 2009. ISIEA 2009. IEEE Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-4681-0
Electronic_ISBN :
978-1-4244-4683-4
DOI :
10.1109/ISIEA.2009.5356473