DocumentCode
506538
Title
Infrared spectrum analysis of the gas in coal mine based on SVM
Author
Wang Yuanbin
Author_Institution
Sch. of Electr. & Control Eng., Xi´an Univ. of Sci. & Technol., Xi´an, China
Volume
1
fYear
2009
fDate
20-22 Nov. 2009
Firstpage
608
Lastpage
611
Abstract
Gas detecting in the coal mine is always a significant problem. As the molecule of the gas may absorb the light at some wavelength, analysis on the gas absorbing infrared spectrum can be made for contributing to the gas concentration. On the other hand, coal gas has diversified composition and large concentration range, and the characteristic absorbing spectrum line of the composition overlaps each other, while support vector machine is a kind of machine learning method based on statistical learning theory, and it is mainly useful for small samples, therefore, in this application support vector machine is associated with infrared spectrum analysis to investigate the coal gas. The research concludes the establishment of infrared spectrum data sample, the training and testing on SVM calibration model, the implement of SVM calibration model. The results show that the precision and reliability can satisfy the requirements detecting the gas concentration. The precision and sensitivity is high, the response speed is fast, and gas can be analyzed on line continuously. The proposed approach is helpful and practical.
Keywords
coal; mining industry; spectral analysis; support vector machines; SVM; coal gas; coal mine; gas concentration; gas detection; infrared spectrum analysis; machine learning method; statistical learning theory; support vector machine; Calibration; Electromagnetic wave absorption; Infrared detectors; Infrared spectra; Learning systems; Optical losses; Optical scattering; Optical sensors; Statistical learning; Support vector machines; Support vector machine; coal mine gas; infrared spectrum; spectrum absorption;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-4754-1
Electronic_ISBN
978-1-4244-4738-1
Type
conf
DOI
10.1109/ICICISYS.2009.5357605
Filename
5357605
Link To Document