DocumentCode
506828
Title
Intelligent morphological filter applied to the signal processing of partial discharge for XLPE cable
Author
Wang, Hui ; Zhang, Li ; Huang, Chengjun ; Qian, Yong ; Guo, Canxin ; Liu, Junhua ; Yao, Linpeng ; Jiang, Xiuchen
Author_Institution
Dept. of Electr. Eng., Shanghai Jiao Tong Univ., Shanghai, China
Volume
1
fYear
2009
fDate
20-22 Nov. 2009
Firstpage
708
Lastpage
712
Abstract
Today the sensitive measurement of partial discharge (PD) signals in XLPE cable can be an important element for quality assurance and diagnostics in the factory and during the on-site test procedure. The results clearly indicate that PD analysis of XLPE cable is an excellent online tool to assess its dielectric condition. However, as the serious interference in-field, the acquired PD signals may be interrupted by periodic interferences and white noises, easily. This paper describes an intelligent morphological filter algorithm to remove the periodic pulse interference and white noise contained in the PD signals. The algorithm consists of two stages of morphological processing. The performance of the algorithm is evaluated with simulated and real PD signals. Compared with classical wavelet, there are substantial improvements in the indexes of average error, root mean square (rms) error and maximum error, especially in reducing distortion of the baseline waveform.
Keywords
XLPE insulation; cable insulation; filtering theory; interference suppression; mathematical morphology; partial discharge measurement; signal denoising; white noise; XLPE cable; morphological filter; partial discharge; periodic pulse interference; white noise; Dielectric measurements; Filters; Interference; Partial discharge measurement; Partial discharges; Production facilities; Quality assurance; Signal processing; Signal processing algorithms; White noise; XLPE cable; baseline waveform; intelligent morphlogical filter; partial discharge; wavelet;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-4754-1
Electronic_ISBN
978-1-4244-4738-1
Type
conf
DOI
10.1109/ICICISYS.2009.5358397
Filename
5358397
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