DocumentCode :
50690
Title :
Switching of Dipole Coupled Multiferroic Nanomagnets in the Presence of Thermal Noise: Reliability of Nanomagnetic Logic
Author :
Fashami, Mohammad Salehi ; Munira, Kamaram ; Bandyopadhyay, Supriyo ; Ghosh, Avik W. ; Atulasimha, Jayasimha
Author_Institution :
Dept. of Mech. & Nucl. Eng., Virginia Commonwealth Univ., Richmond, VA, USA
Volume :
12
Issue :
6
fYear :
2013
fDate :
Nov. 2013
Firstpage :
1206
Lastpage :
1212
Abstract :
The stress-induced switching behavior of a multiferroic nanomagnet, dipole coupled to a hard nanomagnet, is numerically studied by solving the stochastic Landau-Lifshitz-Gilbert equation for a single-domain macrospin state. Different factors were found to affect the switching probability in the presence of thermal noise at room temperature: 1) dipole coupling strength, 2) stress levels, and 3) stress withdrawal rates (ramp rates). We report that the thermal broadening of the magnetization distribution causes large switching error rates. This could render nanomagnetic logic schemes that rely on dipole coupling to perform Boolean logic operations impractical whether they are clocked by stress or field or other means.
Keywords :
logic devices; magnetic switching; magnetisation; magnetoelectronics; multiferroics; nanomagnetics; permanent magnets; reliability; stochastic processes; thermal noise; Boolean logic operations; dipole coupled multiferroic nanomagnet switching; dipole coupling strength; hard nanomagnet; magnetization distribution; nanomagnetic logic reliability; nanomagnetic logic schemes; single-domain macrospin state; stochastic Landau-Lifshitz-Gilbert equation; stress levels; stress withdrawal rates; stress-induced switching behavior; switching error rates; switching probability; thermal broadening; thermal noise; Couplings; Magnetization; Magnetomechanical effects; Perpendicular magnetic anisotropy; Stress; Switches; Landau–Lifshitz–Gilbert (LLG) equation; nanomagnetic logic (NML); reliability; straintronics–spintronics; thermal noise;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2013.2284777
Filename :
6632926
Link To Document :
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