• DocumentCode
    5072
  • Title

    Reliability Modeling and Analysis of IEC 61850 Based Substation Protection Systems

  • Author

    Hangtian Lei ; Singh, Chaman ; Sprintson, Alex

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    5
  • Issue
    5
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    2194
  • Lastpage
    2202
  • Abstract
    This paper proposes a novel reliability modeling and analysis methodology for modern substation protection systems. A typical IEC 61850 based substation protection system is designed and analyzed using this methodology as an example. This system includes cyber components such as Merging Units (MUs), Intelligent Electronic Devices (IEDs), and process bus, as well as physical components such as transformers, circuit breakers, and transmission lines. A general technique for cyber-physical system reliability analysis and the concept of cyber-physical interface matrix are presented. The failure modes of individual components and their impacts on the overall system are modeled and numerically analyzed. The utility of the cyber-physical interface matrix in the reliability analysis of a composite power system is also illustrated. The cyber-physical interface matrix is the critical idea that helps making the analysis tractable. The results of our study provide important and precise information for substation reliability evaluation and pave the way for the reliability analysis of complex and large scale cyber-physical systems.
  • Keywords
    IEC standards; matrix algebra; power system reliability; substation automation; substation protection; IEC 61850 based substation protection systems reliability modeling; cyber component; cyber-physical interface matrix; cyber-physical system reliability analysis; failure mode; physical component; power system reliability analysis; Circuit breakers; Circuit faults; Delays; IEC standards; Power system reliability; Reliability; Substations; Cyber-physical interface matrix; IEC 61850; integrated system; reliability;
  • fLanguage
    English
  • Journal_Title
    Smart Grid, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1949-3053
  • Type

    jour

  • DOI
    10.1109/TSG.2014.2314616
  • Filename
    6868302