• DocumentCode
    507377
  • Title

    Fast and reliable passivity assessment and enforcement with extended Hamiltonian pencil

  • Author

    Ye, Zuochang ; Silveira, Luis Miguel ; Phillips, Joel R.

  • fYear
    2009
  • fDate
    2-5 Nov. 2009
  • Firstpage
    774
  • Lastpage
    778
  • Abstract
    Passivity is an important property for a macro-model generated from measured or simulated data. Existence of purely imaginary eigenvalues of a Hamiltonian matrix provides useful information in assessing and correcting the passivity of a system. Since direct computation of eigenvalues is very expensive for large-scale systems, several authors have proposed to solve iteratively for a subset of the eigenvalues based on heuristic sampling along the imaginary axis. However, completeness is not guaranteed in such methods and thus potential risk of missing important eigenvalues is difficult to avoid. In this paper we are aiming at finding all eigenvalues efficiently to avoid both the high cost and the potential risk of missing important eigenvalues. The idea of the proposed method is to convert the Hamiltonian matrix to an equivalent sparse form, termed the ¿extended Hamiltonian pencil¿, and solve for its eigenvalues efficiently using a special eigensolver. Experiments on several realistic systems demonstrate an 80X speed-up compared with standard direct eigensolvers.
  • Keywords
    eigenvalues and eigenfunctions; integrated circuit modelling; matrix algebra; Hamiltonian matrix; Hamiltonian pencil; eigenvalues; heuristic sampling; large-scale systems; macro-model; passivity assessment; passivity enforcement; standard direct eigensolvers; Circuits; Costs; Eigenvalues and eigenfunctions; Frequency; Large-scale systems; Numerical simulation; Sampling methods; Scattering parameters; Sparse matrices; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-60558-800-1
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • Filename
    5361210