Title :
A parallel preconditioning strategy for efficient transistor-level circuit simulation
Author :
Thornquist, Heidi K. ; Keiter, Eric R. ; Hoekstra, Robert J. ; Day, David M. ; Boman, Erik G.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
We describe a parallel computing approach for large-scale SPICE-accurate circuit simulation, which is based on a new strategy for the parallel preconditioned iterative solution of circuit matrices. This strategy consists of several steps, including singleton removal, block triangular form (BTF) reordering, hypergraph partitioning, and a block Jacobi pre-conditioner. Our parallel implementation makes use of a mixed load balance, employing a different parallel partition for the matrix load and solve. Based on message-passing, our circuit simulation code was originally designed for large parallel computers, but for the purposes of this paper we demonstrate that it also gives good parallel speedup in modern multi-core environments. We show that our new parallel solver outperforms a serial direct solver, a parallel direct solver and an alternative iterative solver on a set of circuit test problems.
Keywords :
SPICE; circuit simulation; transistor circuits; block Jacobi pre-conditioner; block triangular form; circuit test problems; efficient transistor; hypergraph partitioning; large-scale SPICE; level circuit simulation; mixed load balance; parallel computing approach; parallel preconditioned iterative solution; parallel preconditioning strategy; singleton removal; Algorithm design and analysis; Circuit simulation; Circuit testing; Computational modeling; Concurrent computing; Iterative methods; Jacobian matrices; Laboratories; Partitioning algorithms; SPICE; circuit simulation; hypergraph partitioning; iterative matrix solvers; multi-core; parallel simulation; preconditioners;
Conference_Titel :
Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-60558-800-1
Electronic_ISBN :
1092-3152