• DocumentCode
    507431
  • Title

    Retiming and time borrowing: Optimizing high-performance pulsed-latch-based circuits

  • Author

    Lee, Seonggwan ; Paik, Seungwhun ; Shin, Youngsoo

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2009
  • fDate
    2-5 Nov. 2009
  • Firstpage
    375
  • Lastpage
    380
  • Abstract
    Pulsed-latches take advantage of both latches in their high performance and flip-flops in their convenience of timing analysis. To minimize the clock period of pulsed-latch-based circuits for a higher performance, a problem of combined retiming and time borrowing is formulated, where the latter is enabled by using a handful of different pulse widths. The problem is first approached by formulating it as an integer linear programming to lay a theoretical foundation. A heuristic approach is proposed, which solves the problem by performing clock skew scheduling for the minimum clock period and gradually converting skew into a combination of retiming and time borrowing. Experiments with 45-nm technology demonstrate that the clock period close to the minimum can be achieved for all benchmark circuits with an average of 1.03× with less use of extra latches compared to the conventional retiming.
  • Keywords
    clocks; flip-flops; heuristic programming; linear programming; timing; clock period; conventional retiming; flip-flops; heuristic approach; high-performance pulsed-latch-based circuits; higher performance; integer linear programming; size 45 nm; time borrowing; timing analysis; Algorithm design and analysis; Clocks; Flip-flops; Integrated circuit technology; Latches; Logic; Pulse circuits; Pulse generation; Space vector pulse width modulation; Timing; Pulsed-latch; clock period; retiming; sequential circuit; time borrowing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-60558-800-1
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • Filename
    5361266