Title :
Consistency-based characterization for IC Trojan detection
Author :
Alkabani, Yousra ; Koushanfar, Farinaz
Author_Institution :
CS Dept., Rice Univ., Houston, TX, USA
Abstract :
A Trojan attack maliciously modifies, alters, or embeds unplanned components inside the exploited chips. Given the original chip specifications, and process and simulation models, the goal of Trojan detection is to identify the malicious components. This paper introduces a new Trojan detection method based on nonintrusive external IC quiescent current measurements. We define a new metric called consistency. Based on the consistency metric and properties of the objective function, we present a robust estimation method that estimates the gate properties while simultaneously detecting the Trojans. Experimental evaluations on standard benchmark designs show the validity of the metric, and demonstrate the effectiveness of the new Trojan detection.
Keywords :
electric current measurement; integrated circuit measurement; integrated circuit testing; invasive software; IC Trojan detection; Trojan attack; consistency metric; consistency-based characterization; nonintrusive external IC quiescent current measurements; Business; CMOS technology; Calibration; Current measurement; Fabrication; Foundries; Integrated circuit modeling; Permission; Semiconductor device modeling; Testing;
Conference_Titel :
Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-60558-800-1
Electronic_ISBN :
1092-3152