Title :
Research on a Novel Series-Connected Voltage Fluctuation Generator
Author :
Shan, Renzhong ; Yin, Zhongdong ; Xiao, Xiangning
Author_Institution :
Key Lab. of Power Syst. Protection & Dynamic Security Monitoring & Control of Minist. of Educ., North China Electr. Power Univ., Beijing, China
Abstract :
A novel voltage fluctuation and flicker generating main circuit topology is proposed in this paper, combined with passive and active to realize voltage fluctuation and flicker. The fundamental frequency power is supplied by system source and the other frequency fluctuation power is supplied by active components, so the capacitor of generator is easy to realize larger because of lower active loss. Full-bridge diode rectifier is adopted to maintain the stable DC-bus voltage, the later inverter is controlled by instantaneous value voltage and current double closed-loop to make sure good static and dynamic performance. The inverter output two frequency voltage waveforms, and added to fundamental frequency sinusoidal voltage waveform by transformer so that the typical sinusoidal modulation voltage fluctuation and flicker waveform is obtained. The simulation model is set up on the platform of Matlab/Simulink. Finally, the simulation and experimental results show that the proposed main circuit and control strategy is feasible and efficient.
Keywords :
power system harmonics; rectifiers; active components; current double closed-loop; flicker generating main circuit topology; flicker waveform; frequency fluctuation power; frequency voltage waveforms; full-bridge diode rectifier; fundamental frequency power; instantaneous value voltage; series-connected voltage fluctuation generator; sinusoidal modulation voltage fluctuation; sinusoidal voltage waveform; stable DC-bus voltage; Capacitors; Circuit simulation; Circuit topology; Diodes; Frequency; Inverters; Power generation; Power supplies; Rectifiers; Voltage fluctuations;
Conference_Titel :
Energy and Environment Technology, 2009. ICEET '09. International Conference on
Conference_Location :
Guilin, Guangxi
Print_ISBN :
978-0-7695-3819-8
DOI :
10.1109/ICEET.2009.291