DocumentCode
509514
Title
An Iterative Electrical Capacitance Tomography Image Reconstruction Algorithm
Author
Yan, Hua ; Liu, Li Jun ; Qiang, Da Zhuang
Author_Institution
Sch. of Inf. Sci. & Eng., Shenyang Univ. of Technol., Shenyang, China
Volume
1
fYear
2009
fDate
12-14 Dec. 2009
Firstpage
310
Lastpage
313
Abstract
Conventional electrical capacitance tomography (ECT) image reconstruction relies on the sensitivity matrix of ECT sensor. The linear back-projection algorithm using sensitivity matrix, (LBP_SM for short) and the Landweber Iterative algorithm using sensitivity matrix (I_SM for short) are the most widely used algorithms. An iterative ECT reconstruction algorithm is researched in this paper. Its ECT forward model is obtained by using multivariate linear regression, and its solution of the inverse problem is obtained by iteration, so we call this algorithm I_MLR for short. Capacitance values of a 16-electrode ECT sensor under 10 permittivity distributions are calculated using ECT finite element analysis software. Reconstruction images and reconstruction errors generated by above three algorithms are compared. Comparison results show that I_MLR algorithm can produce much better images than can the LBP_SM algorithm; better images than can the I_SM algorithm in most cases.
Keywords
computerised tomography; finite element analysis; image reconstruction; iterative methods; regression analysis; ECT sensor; Landweber Iterative algorithm; electrical capacitance tomography; finite element analysis; image reconstruction; linear backprojection algorithm; multivariate linear regression; sensitivity matrix; Capacitive sensors; Electrical capacitance tomography; Finite element methods; Image reconstruction; Image sensors; Inverse problems; Iterative algorithms; Linear regression; Permittivity; Reconstruction algorithms; electrical capacitance tomography; iteration; reconstruction algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Design, 2009. ISCID '09. Second International Symposium on
Conference_Location
Changsha
Print_ISBN
978-0-7695-3865-5
Type
conf
DOI
10.1109/ISCID.2009.85
Filename
5370895
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