DocumentCode
509980
Title
Improving memory Bank-Level Parallelism in the presence of prefetching
Author
Lee, Chang Joo ; Narasiman, Veynu ; Mutlu, Onur ; Patt, Yale N.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
fYear
2009
fDate
12-16 Dec. 2009
Firstpage
327
Lastpage
336
Abstract
DRAM systems achieve high performance when all DRAM banks are busy servicing useful memory requests. The degree to which DRAM banks are busy is called DRAM Bank-Level Parallelism (BLP). This paper proposes two new cost-effective mechanisms to maximize DRAM BLP. BLP-Aware Prefetch Issue (BAPI) issues prefetches into the on-chip Miss Status Holding Registers (MSHRs) associated with each core in a multi-core system such that the requests can be serviced in parallel in different DRAM banks. BLP-Preserving Multi-core Request Issue (BPMRI) does the actual loading of the DRAM controller´s request buffers so that requests from the same core can be serviced in parallel, minimizing the serialization of each core´s concurrent requests. When combined, BAPI and BPMRI improve system performance by 11.7% on a 4-core CMP system for a wide variety of multiprogrammed workloads. BAPI and BPMRI also complement various existing DRAM scheduling and prefetching algorithms, and can be used in conjunction with them.
Keywords
DRAM chips; microcontrollers; parallel memories; scheduling; storage management; storage management chips; BLP-aware prefetch issue; DRAM bank level parallelism; DRAM controller; DRAM scheduling; DRAM systems; buffers; memory bank-level parallelism; memory requests; miss status holding registers; multicore system; multiprogrammed workloads; prefetching algorithms; Delay; Out of order; Parallel processing; Permission; Prefetching; Processor scheduling; Random access memory; Registers; System performance; System-on-a-chip; Design; Performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microarchitecture, 2009. MICRO-42. 42nd Annual IEEE/ACM International Symposium on
Conference_Location
New York, NY
ISSN
1072-4451
Print_ISBN
978-1-60558-798-1
Type
conf
Filename
5375399
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