DocumentCode :
510239
Title :
Structure Extracting and Matching Based on Similarity-Pictorial Structure Model for Microscopic Images
Author :
Liu, Sheng ; Du, Xiaoyan ; Zhang, Jianhua
Author_Institution :
Coll. of Comput. Sci. & Technol., Zhejiang Univ. of Technol., Hangzhou, China
Volume :
3
fYear :
2009
fDate :
7-8 Nov. 2009
Firstpage :
181
Lastpage :
185
Abstract :
An improved pictorial structure method (PS) is presented in this paper for structure detecting and matching in microscopic images of the micro structure fabricated using micro-fabrication technology. The obtained structure information of the micro objects is important for the following 3D visual calculation process. Although PS method can extract and match features successfully by evaluating the appearance and shape under slightly varying illumination, while the microscopic images are taken under considerable varying illumination, appearance description of traditional PS model performs poor for our application. In this paper, self-similarity descriptors were used for features extracting and appearance describing for images of micro objects under large changed illumination. The special local features on the micro objects ensure the feasibility of self-similarity method. In the proposed method, the self-similarity descriptors of patches which reflect the information of local object structure are extracted. At the same time, the geometric relationship among patches is modeled by PS. By using our similarity-pictorial structure method (combination of local self-similarity descriptors and pictorial structure model), the structure of object can be extracted and matched exactly. Finally, contrast experiments between PS method and our method for structure extracting and matching on object structure in microscopic images of MEMS components under large changed illumination are presented. Experiment results show the effectiveness of our proposed method.
Keywords :
feature extraction; image matching; microfabrication; 3D visual calculation process; MEMS components; PS method; feature extraction; illumination; image structure extraction; improved pictorial structure method; microfabrication technology; microscopic image matching; microstructure fabrication; self-similarity descriptors; similarity-pictorial structure model; Computer vision; Data mining; Feature extraction; Image edge detection; Image reconstruction; Lighting; Micromechanical devices; Microscopy; Robotic assembly; Solid modeling; Local self-similarity descriptor; Pictorial structure; Structure detecting and matching; microscopic images;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Artificial Intelligence and Computational Intelligence, 2009. AICI '09. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3835-8
Electronic_ISBN :
978-0-7695-3816-7
Type :
conf
DOI :
10.1109/AICI.2009.331
Filename :
5376596
Link To Document :
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