DocumentCode :
510436
Title :
Investigation on the aging characteristics of high-power white LEDs under different stresses
Author :
Yan, Jing ; Shang, Zhendong ; Chen, Jianxin
Author_Institution :
Beijing Optoelectronic Technology Laboratory, Beijing University of Technology, 100124, China
fYear :
2009
fDate :
2-6 Nov. 2009
Firstpage :
1
Lastpage :
2
Abstract :
In accelerated life tests, the 1-W white LEDs were treated with high temperature and DC current distinctively. The tendencies of the light output decaying in the two conditions were basically the same, while the changing trends of the color temperature were different. The hard silica gels have better stability.
Keywords :
Aging; Degradation; Life estimation; Life testing; Light emitting diodes; Optical devices; Packaging; Silicon compounds; Stress; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
Conference_Location :
Shanghai, China
Print_ISBN :
978-1-55752-877-3
Electronic_ISBN :
978-1-55752-877-3
Type :
conf
Filename :
5377097
Link To Document :
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