• DocumentCode
    510530
  • Title

    High data rate 850 nm oxide VCSEL for 20 Gb/s application and beyond

  • Author

    Ji, Chen ; Wang, Jingyi ; Söderström, David ; Giovane, Laura

  • Author_Institution
    Avago Technologies, III-V device R&D group, Fiber Optics Product Division, 350 West Trimble Rd. San Jose, CA 95131, USA
  • fYear
    2009
  • fDate
    2-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper we report 850nm oxide VCSEL operating at up to 25 Gb/s (PRBS31) with 5dB ER, based on a high volume manufacturing platform with MOCVD grown GaAs/AlGaAs epi-material. We will also discuss VCSEL characterization results relevant for optical transceiver applications beyond 10Gb/s.
  • Keywords
    Bandwidth; Costs; Gallium arsenide; High speed optical techniques; MOCVD; Optical arrays; Optical interconnections; Stimulated emission; Transceivers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
  • Conference_Location
    Shanghai, China
  • Print_ISBN
    978-1-55752-877-3
  • Electronic_ISBN
    978-1-55752-877-3
  • Type

    conf

  • Filename
    5377194