Title :
Electron swarm coefficients of CF3I and CF3I-N2 and their comparison with those of SF6
Author :
Juárez, A.M. ; Basurto, E. ; Hernández-Avila, J.L. ; de Urquijo, J.
Author_Institution :
Inst. de Cienc. Fisicas, Univ. Nac. Autonoma de Mexico, Cuernavaca, Mexico
Abstract :
This paper reports the measurement of the electron drift velocity, the longitudinal diffusion coefficient, the ratio between the longitudinal diffusion coefficient and the electron mobility, and the effective ionisation coefficient for electrons in pure CF3I and CF3I-N2 mixtures. A pulsed Townsend technique was used. The E/N range covered was 100-850 Td (1 Td=10-17 V cm2). The limiting or critical field strength for CF3I was found to be E/Nlim=437 Td, which is 21% higher than that of SF6 (E/Nlim=360 Td), a widely used insulating gas. Moreover, the curve of the effective ionization coefficients for the 70% CF3I-N2 mixture bears a very similar behaviour to that of pure SF6 in the vicinity of E/Nlim. Thus, from the point of view of this parameter, CF3I seems to be superior in dielectric behaviour to SF6. Admittedly, many other tests are necessary to regard CF3I as a good dielectric and a likely substitute to SF6 in high voltage and switchgear applications.
Keywords :
carbon compounds; electron mobility; ionisation; nitrogen; plasma diagnostics; plasma dielectric properties; plasma transport processes; CF3I; CF3I-N2; CF3I-N2 mixture; critical field strength; effective ionisation coefficient; electron drift velocity; electron mobility; electron swarm coefficients; high voltage application; insulating gas; longitudinal diffusion coefficient; pulsed Townsend technique; switchgear application; Capacitance measurement; Current measurement; Dielectrics and electrical insulation; Displacement measurement; Electron mobility; Gas insulation; Ionization; Pressure measurement; Sulfur hexafluoride; Velocity measurement;
Conference_Titel :
Gas Discharges and Their Applications, 2008. GD 2008. 17th International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-0-9558052-0-2