DocumentCode :
511351
Title :
Simulation and analysis of single-electron transistors with 1-dimension multiple islands
Author :
Sui, Bingcai ; Chi, Yaqing ; Zhou, Hailiang ; Zhang, Chao ; Fang, Liang
Author_Institution :
Nat. Lab. of Parallel & Distrib. Process., Nat. Univ. of Defense Technol., Changsha, China
fYear :
2009
fDate :
26-30 July 2009
Firstpage :
695
Lastpage :
698
Abstract :
Single-electronic transistors (SETs) are considered as the attractive candidates for post-COMS VLSI due to their ultra-small size and low power consumption. Because SETs with single island can not work at room temperature normally, more and more researchers begin to make research on the SETs with 1-dimension multi-islands. Based on the Monte Carlo (MC) and stable diagram method, the critical problems during simulating and analyzing the SETs with multi-islands are investigated, e.g. capacitance matrix, potential of the islands, the free energy and so on. Meanwhile, double-island SET is simulated and analyzed as an example of SETs with 1-D muti-islands in detail. For the first time, 3-D stable diagram is obtained, and some new phenomena are analyzed in the paper. And through analyzing the result it´s shown that although SETs with 1-D muti-islands is more useful and powerful than SETs with single island, there inevitably exists many effects because of the coupling energy between the islands.
Keywords :
Monte Carlo methods; semiconductor device models; transistors; Monte Carlo method; capacitance matrix; coupling energy; free energy; low power consumption; multiislands; one-dimension multiple islands; post-COMS VLSI; single-electron transistors; stable diagram method; Analytical models; Capacitance; Capacitors; Carbon nanotubes; Energy consumption; Single electron transistors; Temperature; Tunneling; Very large scale integration; Voltage; Monte Carlo simulation; multiple islands; single-electron transistor; single-electron tunneling device;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location :
Genoa
ISSN :
1944-9399
Print_ISBN :
978-1-4244-4832-6
Electronic_ISBN :
1944-9399
Type :
conf
Filename :
5394481
Link To Document :
بازگشت