DocumentCode :
511485
Title :
Taguchi methodology to grow single-walled carbon nanotubes on silicon wafer
Author :
Jaybhaye, Sandesh ; Sharon, Maheshwar ; Ansaldo, Alberto ; Ricci, Davide ; Singh, Laxminarayan ; Di Zitti, Ermanno
Author_Institution :
Nanotechnol. Res. Center, Birla Coll. of Arts, Sci. & Commerce, Kalyan, India
fYear :
2009
fDate :
26-30 July 2009
Firstpage :
827
Lastpage :
830
Abstract :
Single-walled carbon nanotubes (SWCNTs) were grown by ethanol chemical vapor deposition (ECVD) and growth parameters were optimized using the Taguchi optimization technique. Optimized parameters such as catalyst, spin coating speed, temperature and flow rate of carrier gas are found to be cobalt (Co) and 5% nickel (Ni), 2000 rpm, 900°C, and 100 sccm (argon and 5% hydrogen), respectively. SWCNTs obtained with optimized parameters on SiO (100) substrate show length that ranges form several hundreds of nanometers to a few micrometers and diameters in 1 nm to 3 nm range. Spin coating at 2000 rpm and drying at 8000 rpm are the desired speeds to form the nanosized metal particles for growing small diameter dense network of SWCNTs. Morphological differences between SWCNTs grown with different parameters are studied and discussed by atomic force microscopy and scanning electron microscopy.
Keywords :
Taguchi methods; atomic force microscopy; carbon nanotubes; chemical vapour deposition; scanning electron microscopy; spin coating; C; Co; Ni; SiO; Taguchi optimization; atomic force microscopy; catalyst; cobalt; ethanol chemical vapor deposition; nickel; scanning electron microscopy; silicon wafer; single-walled carbon nanotubes; spin coating; substrate; temperature 900 degC; Atomic force microscopy; Carbon nanotubes; Chemical vapor deposition; Coatings; Cobalt; Ethanol; Nickel; Scanning electron microscopy; Silicon; Temperature; Taguchi methods; chemical vapor deposition; optimization; single-walled carbon nanotubes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location :
Genoa
ISSN :
1944-9399
Print_ISBN :
978-1-4244-4832-6
Electronic_ISBN :
1944-9399
Type :
conf
Filename :
5394677
Link To Document :
بازگشت