• DocumentCode
    511495
  • Title

    Local evaluation of stiffness distribution for biological organism by nanoprobes inside ESEM

  • Author

    Nakajima, Masahiro ; Ahmad, Mohd Ridzuan ; Hisamoto, Naoki ; Kojima, Masaru ; Homma, Michio ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
  • fYear
    2009
  • fDate
    26-30 July 2009
  • Firstpage
    401
  • Lastpage
    402
  • Abstract
    The novel local stiffness evaluations of biological organism is presented though the analysis of deformation by nanoprobe inside an Environmental-Scanning Electron Microscope (E-SEM). The stiffness values are important to reveal and evaluate the cell condition depending on health, diagnosis, growth phase, and so on. The E-SEM provides the real-time high resolution image under water-contained condition. We have been applied this system for nano-biomanipulation environment based on nanorobotic manipulators. The deformation of the biological organism can be observed by E-SEM with real-time imaging. In this paper, the local stiffness of Caenorhabditis elegans (C. elegans) is evaluated. The deformation area was dynamically changed by the applied forces of nanoprobes. The silicon nanoprobes were fabricated by Focus Ion Beam (FIB) etching at the tip of Atomic Force Microscope (AFM) cantilever. The deformation area can be modeled by continuum model such as a Maxwell model. The distribution of the different local points will be evaluated by the proposed stiffness evaluation method.
  • Keywords
    biomechanics; biosensors; cellular biophysics; deformation; elastic constants; nanosensors; scanning electron microscopy; silicon; Atomic Force Microscope cantilever; Caenorhabditis elegans; ESEM; Environmental-Scanning Electron Microscope; Focus Ion Beam etching; Maxwell model; biological organism; continuum model; deformation; local stiffness evaluations; nanobiomanipulation; nanorobotic manipulators; silicon nanoprobes; stiffness distribution; Atomic force microscopy; Biological systems; Deformable models; Electron microscopy; Focusing; High-resolution imaging; Image resolution; Manipulator dynamics; Nanobioscience; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
  • Conference_Location
    Genoa
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-4832-6
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • Filename
    5394688