DocumentCode :
511495
Title :
Local evaluation of stiffness distribution for biological organism by nanoprobes inside ESEM
Author :
Nakajima, Masahiro ; Ahmad, Mohd Ridzuan ; Hisamoto, Naoki ; Kojima, Masaru ; Homma, Michio ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear :
2009
fDate :
26-30 July 2009
Firstpage :
401
Lastpage :
402
Abstract :
The novel local stiffness evaluations of biological organism is presented though the analysis of deformation by nanoprobe inside an Environmental-Scanning Electron Microscope (E-SEM). The stiffness values are important to reveal and evaluate the cell condition depending on health, diagnosis, growth phase, and so on. The E-SEM provides the real-time high resolution image under water-contained condition. We have been applied this system for nano-biomanipulation environment based on nanorobotic manipulators. The deformation of the biological organism can be observed by E-SEM with real-time imaging. In this paper, the local stiffness of Caenorhabditis elegans (C. elegans) is evaluated. The deformation area was dynamically changed by the applied forces of nanoprobes. The silicon nanoprobes were fabricated by Focus Ion Beam (FIB) etching at the tip of Atomic Force Microscope (AFM) cantilever. The deformation area can be modeled by continuum model such as a Maxwell model. The distribution of the different local points will be evaluated by the proposed stiffness evaluation method.
Keywords :
biomechanics; biosensors; cellular biophysics; deformation; elastic constants; nanosensors; scanning electron microscopy; silicon; Atomic Force Microscope cantilever; Caenorhabditis elegans; ESEM; Environmental-Scanning Electron Microscope; Focus Ion Beam etching; Maxwell model; biological organism; continuum model; deformation; local stiffness evaluations; nanobiomanipulation; nanorobotic manipulators; silicon nanoprobes; stiffness distribution; Atomic force microscopy; Biological systems; Deformable models; Electron microscopy; Focusing; High-resolution imaging; Image resolution; Manipulator dynamics; Nanobioscience; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location :
Genoa
ISSN :
1944-9399
Print_ISBN :
978-1-4244-4832-6
Electronic_ISBN :
1944-9399
Type :
conf
Filename :
5394688
Link To Document :
بازگشت