DocumentCode :
511589
Title :
A low-temperature fabrication process integrated carbon nanotubes-based sensor device into CMOS IC
Author :
Huang, Jung-Tang ; Chang, Po-Chih ; Chao, Hom-Wi ; Hsu, Pei-Lun
Author_Institution :
Dept. of Inst. of Mechatron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
fYear :
2009
fDate :
26-30 July 2009
Firstpage :
678
Lastpage :
681
Abstract :
This paper presents a low temperature fabrication method of carbon nanotubes(CNTs)-based sensors device on a CMOS integrated circuit chip made by TSMC 0.35 ¿m CMOS process. Low temperature processes are the better ways to integrate carbon nanotubes (CNTs) with CMOS chips into array-type gas sensors. Almost the metal used in CMOS is Al-Si-Cu alloy, which make the sustainable temperature of CMOS structures be in the range of 400-500°C. The silicon oxide substrate of CMOS chip was modified with 3-aminopropyltriethoxysilane (APTS) to form aminoterminated (-NH2) on the surface of self-assembled monolayer (SAM). The chemical adhesion of CNTs to surface treated is due to the presence of positive charges or amine groups on the surface. After CNTs film was deposited on silicon oxide, we formed interdigitated electrode (IDE) by lift-off process. Furthermore, the area of CNTs-based sensor device was 500 ¿m ×400 ¿m, and the IDE finger width was 10 ¿m and the smallest gap size was 4 ¿m.
Keywords :
CMOS integrated circuits; adhesion; carbon nanotubes; cryogenic electronics; electrodes; gas sensors; monolayers; self-assembly; silicon compounds; surface treatment; 3-aminopropyltriethoxysilane; C; CMOS integrated circuit chip; CMOS structures; SiO; TSMC CMOS process; amine groups; aminoterminated surface; array-type gas sensors; chemical adhesion; integrated carbon nanotubes-based sensor device; interdigitated electrode; lift-off process; low-temperature fabrication process; positive charges; self-assembled monolayer; silicon oxide substrate; size 0.35 mum; size 10 mum; size 4 mum; size 400 mum; size 500 mum; surface treatment; temperature 400 degC to 500 degC; CMOS integrated circuits; CMOS process; Carbon nanotubes; Fabrication; Gas detectors; Nanoscale devices; Sensor arrays; Silicon; Surface treatment; Temperature sensors; CMOS; Carbon Nanotubes; component; interdigitated electrode; self-assembled monolayer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location :
Genoa
ISSN :
1944-9399
Print_ISBN :
978-1-4244-4832-6
Electronic_ISBN :
1944-9399
Type :
conf
Filename :
5394844
Link To Document :
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