Title :
On wires at low electron densities
Author :
Beiu, Valeriu ; Ibrahim, Walid ; Makki, Rafic Z.
Author_Institution :
Coll. of IT (CIT), UAE Univ. (UAEU), Al Ain, United Arab Emirates
Abstract :
When analyzing reliability, wires have in most cases been ignored, with gates taking the lion´s share, and devices being considered only once in a while. With scaling, this ¿only-computations-fail¿ approach is not going to be accurate enough as wires will also start to err. Trying to do justice to communication (wires), this paper details a statistical failure analysis of wires following on the few papers which have made wires´ reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires´ length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to ¿lower bound¿-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for design strategies of multi-/many-cores and networks-on-chip, as well as for forward-looking investigations on emerging nano-architectures.
Keywords :
electron density; electron device noise; failure analysis; integrated circuit interconnections; nanoelectronics; probability; reliability; statistical analysis; wires; electron density; extrinsic noises; intrinsic noises; particle-like probabilistic approach; reliability; statistical failure analysis; wire length-dependent failure probabilities; wires; Educational institutions; Electron traps; Integrated circuit noise; Nanoscale devices; Probability; Quantum computing; Semiconductor device noise; Switches; Telecommunication network reliability; Wires; Nano-electronics; communication; interconnects; noise (intrinsic); reliability; wires;
Conference_Titel :
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location :
Genoa
Print_ISBN :
978-1-4244-4832-6
Electronic_ISBN :
1944-9399